High Performance Computing Resources
● NVIDIA DGX server with 8 × H100
● OSU high performance computer cluster (see OSU HPC capabilities)
Device Fabrication and Electrical Test
● Four probe station with heated chuck
● Keithley 4200A-SCS Semiconductor Device Parameter Analyzer capable of I-V, C-V, Pulse measurement
● Keysight B1500A Semiconductor Device Parameter Analyzer capable of I-V, C-V
● Photolithography, plasma etch, and film deposition tools in OSU cleanroom
Semiconductor Characterization
● AFM, PFM, and MFM are available for shared research facilities